Surface analysis

Secondary Ion Mass Spectrometry (SIMS)

• Mass spectra at a depth penetration of 1-2 nm
• Spatial imaging (resolution of 300nm)
• Depth profiling

Applications:
Surface contamination and treatment coverage studies.

X-ray Photoelectron Spectroscopy (XPS)

• Elemental composition and bonding environments at a depth of ~ 10 nm
• Spatial imaging (resolution of 6 µm)
• Depth profiling with an in-situ argon etching system

Applications:
Tracking compositional changes during chemical processes such as photodegradation.

Right: Image of the XPS equipment. XPS was used to obtain data on the elemental composition of a surface treatment applied to engineering components to improve their oxidative stability. Results of the XPS analysis enabled FaraPack Polymers to identify suppliers of coating materials with the same elemental composition.

Scanning Electron Microscopy (SEM)

• Topographical images on the millimetre scale
• high spatial resolution (maximum 1.2 nm)

Applications:
Imaging diverse objects such as fibres and particles.

Right: Scanning Electron Micrograph of electrospun polymer fibres. These fibres were prepared as a scaffold for tissue engineering. In this study a knowledge of the structure of a fibre 'pad' was essential to evaluate how it would interact with cells, and so might assist wound healing.

Atomic Force Microscopy (AFM)

• Imaging under fluids and ambient conditions
• Imaging on the micrometre scale with nm resolution
• Spatial mapping of surfaces properties such as hardness and hydrophilicity

Applications:
Studying phase separation in polymer blends and smart polymer systems under fluids.

Right: AFM image of the surface contours of an organic semiconductor polymer blend on the nanometre scale.